Crafting designs for zero-defect manufacturing.
Design For Test (DFT)
Overview
Offering top-quality and highly-efficient DFT process and methodology with in-depth experience in all EDA tools to enable a design with the highest coverage and lowest test times.
Do it right with Neurealm
Our Offerings
- DFT architecture definition
- RTL modification for DFT-friendly design
- Low power and topographical synthesis
- Hierarchical DFT implementation and full-chip porting
- DFT SDC generation for STA
- DFT (JTAG, SCAN, MBIST) insertion and verification
- ATPG pattern generation and Timing simulation
- Test coverage analysis and improvement
- Post-silicon pattern delivery and pattern debug
- DFT DRC checks and fixes
DFT Stages
Architecture and Planning
- IO scan channel, pin usage, and block chains allocation planning
- BSCAN-JTAG, MBIST-JTAG, IP_JTAG sharing
- SCAN flow – Hierarchical/compression, OCC placement
- 3rd party IP integration
- Block level and Top-level signal planning
- Low power planning
DFT Implementation
- SCAN, OCC, COMP insertion
- MBIST, Repair insertion
- JTAG & BSCAN insertion
- Logic Equivalence check
- Block to Top integration
- DFT DRC cleanup and suggestion for DRC fix
- DFT Lint cleanup
PATTERN Generation & Validation
- JTAG/BSCAN/SCAN/MBIST pattern generation and validation at block level and chip-top level
- Gate level simulation of Patterns – both zero delay and with timing
- Testcase analysis and Improvement
- Pattern delivery
- Pattern debug
DFT Constraints and STA Signoff
- Scan shift mode
- Scan capture mode
- Scan TF mode
- Mbist mode
- Jtag mode
- Bscan mode
